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Proceedings of the 20th Conference on Computer Science and Intelligence Systems (FedCSIS)

Annals of Computer Science and Information Systems, Volume 43

AI classifier of defects in Artworks captured by active infrared thermography

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DOI: http://dx.doi.org/10.15439/2025F7486

Citation: Proceedings of the 20th Conference on Computer Science and Intelligence Systems (FedCSIS), M. Bolanowski, M. Ganzha, L. Maciaszek, M. Paprzycki, D. Ślęzak (eds). ACSIS, Vol. 43, pages 327332 ()

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Abstract. Automatic recognition of features in digital images has become a central topic in the field of cultural heritage diagnostics. AI-based models are being increasingly applied to the analysis of infrared reflectography and thermographic data. They show great promise in automating time-consuming manual analyses and improving the objectivity and repeatability of diagnostic assessments. This work proposes 4 specialized classifiers for nails and detachments in work of Arts. In-situ active thermography measurements are used for training proposed models. AI models for nail classification reached accuracy of 96.03 \% and 93.65 \% using planar composite thermal images and volumetric raw data as inputs, respectively. AI models for detachment classification reached accuracy of 87 \% and 57 \% using planar composite thermal images and volumetric raw data as inputs, respectively.

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